NDLI: Metric Learning Based Structural Appearance Model for Robust Visual Tracking

Content Provider	IEEE Xplore Digital Library
Author	Yuwei Wu Bo Ma Min Yang Jian Zhang Yunde Jia
Copyright Year	1991
Abstract	Appearance modeling is a key issue for the success of a visual tracker. Sparse representation based appearance modeling has received an increasing amount of interest in recent years. However, most of existing work utilizes reconstruction errors to compute the observation likelihood under the generative framework, which may give poor performance, especially for significant appearance variations. In this paper, we advocate an approach to visual tracking that seeks an appropriate metric in the feature space of sparse codes and propose a metric learning based structural appearance model for more accurate matching of different appearances. This structural representation is acquired by performing multiscale max pooling on the weighted local sparse codes of image patches. An online multiple instance metric learning algorithm is proposed that learns a discriminative and adaptive metric, thereby better distinguishing the visual object of interest from the background. The multiple instance setting is able to alleviate the drift problem potentially caused by misaligned training examples. Tracking is then carried out within a Bayesian inference framework, in which the learned metric and the structure object representation are used to construct the observation model. Comprehensive experiments on challenging image sequences demonstrate qualitatively and quantitatively that the proposed algorithm outperforms the state-of-the-art methods.
Sponsorship	IEEE Circuits and Systems Society
Starting Page	865
Ending Page	877
Page Count	13
File Size	68279871
File Format	PDF
ISSN	10518215
Volume Number	24
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Measurement Visualization Vectors Training Dictionaries Image reconstruction Robustness Multi-scale max pooling. Object tracking Appearance modeling Sparse coding Multiple instance metric learning sparse coding multiple instance metric learning multiscale max pooling object tracking
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Media Technology

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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