NDLI: Application-Specific Wear Leveling for Extending Lifetime of Phase Change Memory in Embedded Systems

Content Provider	IEEE Xplore Digital Library
Author	Duo Liu Tianzheng Wang Yi Wang Zili Shao Qingfeng Zhuge Sha, E.H.-M.
Copyright Year	1982
Abstract	Phase change memory (PCM) has been proposed to replace NOR flash and DRAM in embedded systems because of its attractive features. However, the endurance of PCM greatly limits its adoption in embedded systems. As most embedded systems are application-oriented, we can tackle the endurance problem of PCM by exploring application-specific features such as fixed access patterns and update frequencies. In this paper, we propose an application-specific wear leveling technique, called Curling-PCM, to evenly distribute write activities across the whole PCM chip to improve the endurance of PCM in embedded systems. The basic idea is to exploit application-specific features in embedded systems and periodically move the hot region across the whole PCM chip. To reduce the overhead of moving the hot region and improve the performance of PCM-based embedded systems, a fine-grained partial wear leveling policy is proposed for Curling-PCM, by which only part of the hot region is moved during each request handling period. Experimental results show that Curling-PCM can effectively evenly distribute write traffic for a prime application of PCM in embedded systems. We expect this paper can serve as a first step toward the full exploration of application-specific features in PCM-based embedded systems.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	1450
Ending Page	1462
Page Count	13
File Size	2240813
File Format	PDF
ISSN	02780070
Volume Number	33
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Phase change materials Embedded systems Ash Computer architecture Equations Microprocessors Random access memory write activity reduction Application specific endurance phase change memory wear leveling
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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