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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Banerjee, A. Frost, T. Jahangir, S. Bhattacharya, P. |
| Copyright Year | 1965 |
| Abstract | We have investigated the dislocation filtering characteristics of InGaN/GaN quantum dot multilayers grown at the substrate/active layer interface along the c-axis. Etch pit dislocation density measurements reveal a reduction in defect density by a factor of 5, from ~ 5×108 cm-2 to ~ 9.8×107 cm-2 in a GaN overlayer with an optimized quantum dot multilayer. This is accompanied by a reduction of electron and hole trap densities in the GaN layer by a factor of 3 and an increase in the luminescence efficiency of green-emitting In0.35Ga0.65N/GaN quantum dots grown atop such filters. Green-emitting (λ = 525 nm) quantum dot light emitting diodes having optimized dislocation filter show marked improvement in their current-voltage and light-current characteristics and in their external quantum efficiency. The peak efficiency is achieved at an injection level of 27 A/cm2. |
| Sponsorship | IEEE Lasers and Electro-Optics Society |
| Starting Page | 228 |
| Ending Page | 235 |
| Page Count | 8 |
| File Size | 1008938 |
| File Format | |
| ISSN | 00189197 |
| Volume Number | 50 |
| Issue Number | 4 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Gallium nitride Quantum dots Light emitting diodes Temperature measurement Electron traps III-V semiconductor materials Density measurement molecular beam epitaxy Dislocation filter quantum dots gallium nitride light emitting diode |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering |
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