NDLI: An Adaptive Self-Configuration Scheme for Severity Invariant Machine Fault Diagnosis

Content Provider	IEEE Xplore Digital Library
Author	Yaqub, M.F. Gondal, I. Kamruzzaman, J.
Copyright Year	1963
Abstract	Vibration signals, used for abnormality detection in machine health monitoring (MHM), exhibit significant variation with varying fault severity. This signal variation causes overlap among the features characterizing different types of faults, which results in severe performance degradation of the fault diagnostic model. In this paper, a wavelet based adaptive training set and feature selection (WATF) self-configuration scheme is presented, which selects the optimum wavelet decomposition level, and employs adaptive selection of the training set and features. Optimal wavelet decomposition level selection is such that the maximum fault signature-signal energy bands are achieved. The severity variant features, which could cause detrimental class overlap for MHM, are avoided using adaptive selection of the training set and features based on the location of a test data in feature space. WATF uses Support Vector Machines (SVM) to build the fault diagnostic model, and its performance and robustness has been tested with data having different severity levels. Comparative studies of WATF with eight existing fault diagnosis schemes show that, for publicly available data sets, WATF achieves higher fault detection accuracy, even when training and testing data sets belong to different severity levels.
Sponsorship	IEEE Reliability Society
Starting Page	116
Ending Page	126
Page Count	11
File Size	1358896
File Format	PDF
ISSN	00189529
Volume Number	62
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Training Feature extraction Training data Support vector machines Fault diagnosis Wavelet transforms Vectors severity invariant diagnosis Adaptive fault diagnosis machine health monitoring optimal wavelet parameterization
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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