NDLI: Validation of Power Linearity in Terahertz Time-Domain Spectroscopy Using a Programmable Step Attenuator

Content Provider	IEEE Xplore Digital Library
Author	Iida, H. Kinoshita, M. Shimada, Y. Kuroda, H. Kitagishi, K. Izutani, Y.
Copyright Year	1963
Abstract	We have constructed a programmable terahertz step attenuator by stacking metallized-film attenuators (MFAs) of different transmittances. Sputter deposition of Inconel alloy on thin polyester films is used to fabricate the MFAs. Good repeatability and flatness of the step attenuator are confirmed in transmittance measurements by a terahertz time-domain spectroscopy (THz-TDS) system. A method to evaluate the linearity of the THz-TDS system is proposed by using the step attenuator over a wide dynamic range. Calibration curves are analyzed by measuring the transmittance of maltose in different concentrations, and the validity of the proposed method is discussed.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1801
Ending Page	1806
Page Count	6
File Size	857025
File Format	PDF
ISSN	00189456
Volume Number	62
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Attenuators Linearity Attenuation measurement Calibration Dynamic range Attenuation Metals validation Calibration curve linearity maltose metallized film programmable step attenuator terahertz time-domain spectroscopy (THz-TDS)
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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