NDLI: Multi-Loaded Modulated Scatterer Technique for Sensing Applications

Content Provider	IEEE Xplore Digital Library
Author	Capdevila, S. Jofre, L. Romeu, J. Bolomey, J.C.
Copyright Year	1963
Abstract	Modulated scatterer technique (MST) probes have been commonly used for near-field mapping application in antenna measurements as well as in imaging applications. Although they can be used as a general sensor, they present limitations in the amount of information that can be obtained. The paper proposes a new configuration for MST probes that can be used for sensing applications, which consists in using a set of impedances (at least three different impedances) instead of the conventional two impedance loads. Additional sensitive loads, such as thermistors, can be added to the multi-load MST sensor, in order to remotely sense their variation and perform further sensing of parameters which could not always be sensed by conventional MST. The paper presents the formulation and approaches that can be used to exploit the sensing capabilities of such multi-loaded MST sensor, as well as experimental validations through the measurement of the temperature in the neighborhood of the sensor.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	794
Ending Page	805
Page Count	12
File Size	1917579
File Format	PDF
ISSN	00189456
Volume Number	62
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Probes Impedance Sensors Antenna measurements Temperature measurement Loaded antennas thermistors Antennas antenna measurements electromagnetic scattering impedance modulated scatterer technique (MST) probes radio frequency identification (RFID) scattering cross section
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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