NDLI: Guest Editorial Special Section on the First IEEE International Workshop on Measurements and Networking (M&N) 2011, Capri Island, Italy, October 10

Content Provider	IEEE Xplore Digital Library
Author	Petri, D.
Copyright Year	1963
Abstract	The first IEEE International Workshop on Measurements & Networking (M&N), promoted by the Instrumentation and Measurement Society, took place in Capri Island, Italy, on October 10-11, 2011. The main goal of this workshop is to provide a forum for researchers and practitioners from the industry, academia, and government interested in the areas of modeling, measurements, communications, computer science, wireless systems, and sensor networks and to stimulate ideas and discussion about the role of both measurements for communication networks and communication networks for measurements. The workshop gave the opportunity to collect complementary competencies from different fields, and 31 papers were accepted and presented in the two-day workshop, covering highly interdisciplinary topics. Very interesting contributions originating from various scientific backgrounds and expressing diverse viewpoints promoted debates and discussions, thus stimulating many authors to improve their works and submit a technically extended version of their paper for publication on this Special Section. After the usual strict review that papers submitted to this journal undergo, four papers were finally accepted in time for publication on this issue of the IEEE actions on Instrumentation and Measurement. These papers reflect the top quality of the contributions presented at the workshop.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	2
Ending Page	3
Page Count	2
File Size	68364
File Format	PDF
ISSN	00189456
Volume Number	62
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Special issues and sections Modeling Measurement Meetings
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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