NDLI: Architecture-Based Reliability Prediction with the Palladio Component Model

Content Provider	IEEE Xplore Digital Library
Author	Brosch, F. Koziolek, H. Buhnova, B. Reussner, R.
Copyright Year	1976
Abstract	With the increasing importance of reliability in business and industrial software systems, new techniques of architecture-based reliability engineering are becoming an integral part of the development process. These techniques can assist system architects in evaluating the reliability impact of their design decisions. Architecture-based reliability engineering is only effective if the involved reliability models reflect the interaction and usage of software components and their deployment to potentially unreliable hardware. However, existing approaches either neglect individual impact factors on reliability or hard-code them into formal models, which limits their applicability in component-based development processes. This paper introduces a reliability modeling and prediction technique that considers the relevant architectural factors of software systems by explicitly modeling the system usage profile and execution environment and automatically deriving component usage profiles. The technique offers a UML-like modeling notation whose models are automatically transformed into a formal analytical model. Our work builds upon the Palladio Component Model (PCM), employing novel techniques of information propagation and reliability assessment. We validate our technique with sensitivity analyses and simulation in two case studies. The case studies demonstrate effective support of usage profile analysis and architectural configuration ranking, together with the employment of reliability-improving architecture tactics.
Sponsorship	IEEE Computer Society Technical Council on Software Engineering Association for Computing Machinery (ACM) IEEE Computer Society
Starting Page	1319
Ending Page	1339
Page Count	21
File Size	3858434
File Format	PDF
ISSN	00985589
Volume Number	38
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Unified modeling language Software reliability Markov processes Phase change materials Software architecture Software quality Design methodology design tools and techniques Software architectures quality analysis and evaluation reliability
Content Type	Text
Resource Type	Article
Subject	Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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