NDLI: Invariant-Feature-Pattern-Based Form Characterization for the Measurement of Ultraprecision Freeform Surfaces

Content Provider	IEEE Xplore Digital Library
Author	Ming Jun Ren Chi Fai Cheung Ling Bao Kong Xiangqian Jiang
Copyright Year	1963
Abstract	Ultraprecision freeform surfaces (UPFSs) are increasingly being used in advanced optical systems due to their superior optical properties. However, current research on the measurement of machined UPFSs is still hindered by lack of efficient and robust form characterization techniques which can characterize the form error of measured freeform surfaces with submicrometer accuracy. This paper presents an invariant-feature-pattern-based form characterization (IFPFC) method. IFPFC makes use of intrinsic surface features (e.g., Gaussian curvature) to map the surface into an orientation-independent feature pattern to represent the surface geometry. Surface matching and comparison are then undertaken in terms of feature pattern registration. Compared with conventional methods, the IFPFC is not only robust to the initial position of the measured surface relative to the design template but also computationally efficient since it does not involve much iteration. A series of computer simulations and actual measurement are conducted to demonstrate the performance and the validity of the IFPFC method in the measurement and characterization of UPFSs with submicrometer form accuracy.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	963
Ending Page	973
Page Count	11
File Size	661463
File Format	PDF
ISSN	00189456
Volume Number	61
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Surface roughness Rough surfaces Accuracy Surface treatment Surface reconstruction Vectors Image registration surface intrinsic feature Form characterization freeform surfaces precision surface measurement
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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