NDLI: Application of Multiplicative Regularization to the Finite-Element Contrast Source Inversion Method

Content Provider	IEEE Xplore Digital Library
Author	Zakaria, A. LoVetri, J.
Copyright Year	1963
Abstract	Multiplicative regularization is applied to the finite-element contrast source inversion (FEM-CSI) algorithm recently developed for microwave tomography. It is described for the two-dimensional (2D) transverse-magnetic (TM) case and tested by inverting experimental data where the fields can be approximated as TM. The unknown contrast, which is to be reconstructed, is represented using nodal variables and first-order basis functions on triangular elements; the same first-order basis functions used in the FEM solution of the accompanying field problem. This approach is different from other MR-CSI implementations where the contrast variables are located on a uniform grid of rectangular cells and represented using pulse basis functions. The linear basis function representation of the contrast makes it difficult to apply the weighted L₂-norm total variation multiplicative regularization which requires that gradient and divergence operators be applied to the predicted contrast at each iteration of the inversion algorithm; the use of finite-difference operators for this purpose becomes unwieldy. Thus, a new technique is introduced to perform these operators on the triangular mesh.
Sponsorship	IEEE Antennas and Propagation Society
Starting Page	3495
Ending Page	3498
Page Count	4
File Size	270594
File Format	PDF
ISSN	0018926X
Volume Number	59
Issue Number	9
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Finite element methods Microwave theory and techniques Microwave imaging Inverse problems Electromagnetics Antenna measurements multiplicative regularization Contrast source inversion finite-element method microwave tomography
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering

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