NDLI: Signal Integrity Verification of Multichip Links Using Passive Channel Macromodels

Content Provider	IEEE Xplore Digital Library
Author	Chinea, A. Grivet-Talocia, S. Haisheng Hu Triverio, P. Kaller, D. Siviero, C. Kindscher, M.
Copyright Year	2011
Abstract	This paper presents a general strategy for the electrical performance and signal integrity assessment of electrically long multichip links. A black-box time-domain macromodel is first derived from tabulated frequency responses in scattering form. This model is structured as a combination of ideal delay terms with frequency-dependent rational coefficients. A new identification scheme is presented, which is based on an initial blind delay estimation process followed by a refinement loop based on an iterative delayed vector fitting process. Two alternative passivity enforcement schemes based on local perturbations are then presented. The result is an accurate and guaranteed passive delay-based macromodel, which is synthesized as a SPICE-compatible netlist for channel analysis. The proposed procedure enables safe and reliable circuit-based transient simulations of complex multichip links, including nonlinear drivers and receivers. The performance of the proposed flow is demonstrated on a large number of channel benchmarks.
Starting Page	920
Ending Page	933
Page Count	14
File Size	1597708
File Format	PDF
ISSN	21563950
Volume Number	1
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Delay Accuracy Time domain analysis Frequency domain analysis Scattering Data models Optimization scattering parameters Delay extraction high-speed interconnects macromodeling passivity rational approximations
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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