NDLI: Binning Optimization for Transparently-Latched Circuits

Content Provider	IEEE Xplore Digital Library
Author	Min Gong Hai Zhou Li Li Jun Tao Xuan Zeng
Copyright Year	1982
Abstract	With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transparent latches are widely used. In this paper, we formulate and solve the binning optimization problem that decides the bin boundaries and their testing order to maximize the profit (considering the test cost) for a transparently-latched circuit. The problem is decomposed into four sub-problems. First, to compute the clock period distribution of the transparently-latched circuit, a sample-based statistical static timing analysis (SSTA) approach is developed which is based on the generalized stochastic collocation method with the sparse grid technique. The minimal clock period on each sample point is found by solving a minimal cycle ratio problem in the constraint graph. Second, a greedy method is proposed to maximize profit considering both the sales revenue and the test cost by iteratively assigning each boundary to its optimal position. Third, an optimal algorithm of O(n log n) runtime is used to generate the optimal testing order to minimize the test cost, based on alphabetic tree. Last, a simple approach is presented to decide the optimal number of bins, which helps to complete the whole binning scheme with maximal profit. Experiments on all the ISCAS'89 sequential benchmarks with 65 nm technology show 10.68% profit improvement in average. Some comparisons with other methods suggest the advantage of our method. The results also demonstrate that the proposed SSTA method achieves an error of 0.70% and speedup of 110X in average compared with the Monte Carlo simulation.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	270
Ending Page	283
Page Count	14
File Size	1196611
File Format	PDF
ISSN	02780070
Volume Number	30
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Marketing and sales Optimization Clocks Timing Latches Integrated circuit modeling transparent latches Binning optimization speed binning statistical static timing analysis
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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