NDLI: A 160<formula formulatype=inline><tex Notation=TeX>$times$</tex> </formula>120-Pixels Range Camera With In-Pixel Correlated Double Sampling and Fixed-Pattern Noise Correction

Content Provider	IEEE Xplore Digital Library
Author	Perenzoni, M. Massari, N. Stoppa, D. Pancheri, L. Malfatti, M. Gonzo, L.
Copyright Year	1966
Abstract	This paper presents the design and electro-optical test of a 160 × 120-pixels CMOS sensor specifically conceived for Time-Of-Flight 3D imaging. The in-pixel processing allows the implementation of Indirect Time-Of-Flight technique for distance measurement with reset noise removal through Correlated Double Sampling and embedded fixed-pattern noise reduction, whereas a fast readout operation allows the pixels values to be streamed out at a maximum rate of 10 MSample/s. The imager can operate as a fast 2D camera up to 458 fps, as a 3D camera up to 80 fps, or even coupling both operation modes. The chip has been fabricated using a standard 0.18 μm 1P4M 1.8 V CMOS technology with MIM capacitors. The resulting pixel has a pitch of 29.1 μm with a fill-factor of 34% and includes 66 transistors. Distance measurements up to 4.5 m have been performed with pulsed laser light, achieving a best precision of 10 cm at 1 m in real-time at 55 fps and 175 mA current consumption.
Sponsorship	IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE
Starting Page	1672
Ending Page	1681
Page Count	10
File Size	2381410
File Format	PDF
ISSN	00189200
Volume Number	46
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Pixel Noise Cameras Three dimensional displays CMOS integrated circuits Consumer electronics Measurement by laser beam 3D camera CMOS correlated double sampling high-speed imager image sensor non-uniformity correction range finding three-dimensional image sensor time-of-flight
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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