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Content Provider | IEEE Xplore Digital Library |
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Author | Papadopoulos, N.P. Papakostas, D.K. Hatzopoulos, A.A. |
Copyright Year | 2005 |
Abstract | A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE. |
Sponsorship | IEEE Lasers and Electro-Optics Society Optical Society of America |
Starting Page | 150 |
Ending Page | 157 |
Page Count | 8 |
File Size | 1651562 |
File Format | |
ISSN | 1551319X |
Volume Number | 6 |
Issue Number | 4 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-04-01 |
Publisher Place | U.S.A. |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Optical feedback Circuit testing Driver circuits Pulse width modulation Current measurement Circuit simulation Optical pulses Pulse circuits Space vector pulse width modulation Organic light emitting diodes testing Optical feedback pixel driver (OFPD) poly-Si thin-film transistor (TFT) |
Content Type | Text |
Resource Type | Article |
Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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