NDLI: Fast, Non-Monte-Carlo Estimation of Transient Performance Variation Due to Device Mismatch

Content Provider	IEEE Xplore Digital Library
Author	Kim, J. Jones, K.D. Horowitz, M.A.
Copyright Year	2004
Abstract	This paper describes an efficient way of simulating the effects of device random mismatch on circuit transient characteristics, such as variations in delay or in frequency. The proposed method models DC random offsets as equivalent AC pseudo-noises and leverages the fast, linear periodically time-varying (LPTV) noise analysis available from RF circuit simulators. Therefore, the method can be considered as an extension to DCMATCH analysis and offers a large speed-up compared to the traditional Monte Carlo analysis. Although the assumed linear perturbation model is valid only for small variations, it enables easy ways to estimate correlations among variations and identify the most sensitive design parameters to mismatch, all at no additional simulation cost. Three benchmarks measuring the variations in the input offset voltage of a clocked comparator, the delay of a logic path, and the frequency of an oscillator demonstrate the speed improvement of about 100-1000× compared to a 1000-point Monte Carlo method.
Sponsorship	IEEE Circuits and Systems Society
Starting Page	1746
Ending Page	1755
Page Count	10
File Size	1282780
File Format	PDF
ISSN	15498328
Volume Number	57
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit simulation Delay effects Circuit noise Radio frequency Analytical models Monte Carlo methods Radiofrequency identification Costs Frequency measurement Velocity measurement yield mismatch Monte-Carlo analysis sensitivity analysis variability
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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