NDLI: Study of Validity Region of Small Perturbation Method for Two-Layer Rough Surfaces

Content Provider	IEEE Xplore Digital Library
Author	Tabatabaeenejad, A. Moghaddam, M.
Copyright Year	2004
Abstract	We previously derived the bistatic scattering coefficients of a 3-D two-layer dielectric structure with slightly rough boundaries using the small perturbation method (SPM). The use of SPM raises the question about its region of validity, which pertains to the conditions on each layer roughness, slope, and permittivity for which the first-order SPM is accurate within a specified error bound. To this end, the SPM solution needs to be compared with an accurate solution that does not impose roughness restrictions. We use the method of moments to solve an integral equation to analyze electromagnetic scattering from a large ensemble of two-layer structures. Simulations are performed for 1-D rough surfaces represented by zero-mean stationary random processes, separating homogeneous dielectric layers. Observations are reported on the accuracy of the first-order SPM for TM incidence at a fixed incidence angle of 45°.
Sponsorship	IEEE Geoscience and Remote Sensing Society
Starting Page	319
Ending Page	323
Page Count	5
File Size	607020
File Format	PDF
ISSN	1545598X
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Perturbation methods Rough surfaces Surface roughness Scanning probe microscopy Electromagnetic scattering Dielectrics Permittivity Moment methods Integral equations Electromagnetic analysis validity region Bistatic scattering coefficient rough surfaces small perturbation method (SPM) two-layer dielectric structure
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Geotechnical Engineering and Engineering Geology

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