NDLI: Robust Surface Reconstruction via Laplace-Beltrami Eigen-Projection and Boundary Deformation

Content Provider	IEEE Xplore Digital Library
Author	Yonggang Shi Rongjie Lai Morra, J.H. Dinov, I. Thompson, P.M. Toga, A.W.
Copyright Year	1982
Abstract	In medical shape analysis, a critical problem is reconstructing a smooth surface of correct topology from a binary mask that typically has spurious features due to segmentation artifacts. The challenge is the robust removal of these outliers without affecting the accuracy of other parts of the boundary. In this paper, we propose a novel approach for this problem based on the Laplace-Beltrami (LB) eigen-projection and properly designed boundary deformations. Using the metric distortion during the LB eigen-projection, our method automatically detects the location of outliers and feeds this information to a well-composed and topology-preserving deformation. By iterating between these two steps of outlier detection and boundary deformation, we can robustly filter out the outliers without moving the smooth part of the boundary. The final surface is the eigen-projection of the filtered mask boundary that has the correct topology, desired accuracy and smoothness. In our experiments, we illustrate the robustness of our method on different input masks of the same structure, and compare with the popular SPHARM tool and the topology preserving level set method to show that our method can reconstruct accurate surface representations without introducing artificial oscillations. We also successfully validate our method on a large data set of more than 900 hippocampal masks and demonstrate that the reconstructed surfaces retain volume information accurately.
Sponsorship	IEEE Engineering in Medicine and Biology Society IEEE Nuclear and Plasma Sciences Society IEEE Signal Processing Society IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society
Page Count	14
File Size	1610390
Starting Page	2009
Ending Page	2022
File Format	PDF
ISSN	02780062
Volume Number	29
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Robustness Surface reconstruction Topology Image reconstruction Biomedical imaging Shape USA Councils Geometry Image analysis Performance analysis topology Deformation eigen-projection Laplace-Beltrami eigen-function mask outlier surface reconstruction
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Computer Science Applications Radiological and Ultrasound Technology Software

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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