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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ruiz, J. Gutierrez, J.J. Lazkano, A. Ruiz de Gauna, S. |
| Copyright Year | 1963 |
| Abstract | This paper presents an analysis of the flicker assessment by block 5 of the International Electrotechnical Commission (IEC) flickermeter. We compare the values provided by the IEC flickermeter from field measurements and the complaints from the customers. We also analyze the behavior of the IEC flickermeter when subject to signals containing nonuniform rectangular fluctuations. Finally, as it is not easy to find a consistent relationship between the true annoyance and the flicker severity, we describe some laboratory subjective tests with a small group of people, carried out to assign a true quantitative value of annoyance to a nonuniform light fluctuation from real situations. Block 5 of the IEC flickermeter derives its estimate of the annoyance accurately only for uniform fluctuations. In realistic conditions, when the voltage fluctuations are not uniform but have varying frequencies and amplitudes, the IEC flickermeter does not assess the true flicker annoyance precisely. |
| Sponsorship | IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc |
| Starting Page | 2037 |
| Ending Page | 2047 |
| Page Count | 11 |
| File Size | 844837 |
| File Format | |
| ISSN | 00189456 |
| Volume Number | 59 |
| Issue Number | 8 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Voltage fluctuations IEC standards Laboratories Testing Lighting Performance evaluation Signal analysis Frequency Power quality rectangular voltage fluctuation Flicker International Electrotechnical Commission (IEC) flickermeter $P_{\rm st}$ power quality |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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