NDLI: Tomographic Imaging of Surface Deformation From Scarce Measurements via Sinogram Recovery

Content Provider	IEEE Xplore Digital Library
Author	Constantino, E.P.A. Ozanyan, K.B.
Copyright Year	2001
Abstract	Imaging from limited data is a common practice in many industrial tomography applications where sensor design often assumes an irregular approach with low number of measurements. In this paper, we propose a novel algorithm that reduces the task of hard-field imaging from incomplete data to a sinogram recovery problem. The algorithm utilises a novel angular interpolation scheme, employing the sinusoidal Hough transform, to identify sinusoidal traces in the sinogram and estimate missing sinogram samples along such traces. Together with the detailed theory behind the algorithm, we present its performance with experimental data obtained from a photonic guided path tomography system. The targeted subject function is the induced deformation in the quasi-planar surface of a flexible ~1 m² sensor, fixed to an underlying soft-foam mat. The set of 32 independent measurements generated by the system are presented in a severely sparse 91times180 sinogram image. The sinogram is then recovered to a degree suitable for standard tomographic algorithms for hard-field data inversion, such as filtered back-projection.
Sponsorship	IEEE Sensors Council
Starting Page	399
Ending Page	410
Page Count	12
File Size	3853630
File Format	PDF
ISSN	1530437X
Volume Number	9
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Algorithm design and analysis Iterative algorithms Image reconstruction Sensor systems Image sensors Interpolation Single photon emission computed tomography Optoelectronic and photonic sensors Data visualization Monitoring sinogram recovery Hard-field tomography Hough transform sparse-angle tomography
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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