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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Copyright Year | 1984 |
| Description | 3D IC solutions have been developed for several different reasons: to reduce the system form factor for portable platforms; to increase system performance by alleviating the interconnect-delay bottleneck; and to manage overall system cost by stacking heterogeneous chips, rather than integrate diverse system components into a single chip through 2D scaling. However, although some 3D IC markets are emerging, and most technical issues of 3D integration are almost solved, several thermal and production-test challenges remain as obstacles. This special issue of IEEE Design & Test takes a look a those issues. |
| Sponsorship | IEEE Computer Society |
| Starting Page | 2 |
| Ending Page | 2 |
| Page Count | 1 |
| File Size | 407009 |
| File Format | |
| ISSN | 07407475 |
| Volume Number | 26 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) Computer Society |
| Publisher Date | 2009-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Stacking Three-dimensional integrated circuits Production Semiconductor device testing Hardware Propulsion System performance Costs Research and development Semiconductor device measurement interconnect-delay bottleneck 3D IC design and test integration |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering Software Hardware and Architecture |
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