NDLI: Integrated Optical Six-Port Reflectometer in Silicon on Insulator

Content Provider	IEEE Xplore Digital Library
Author	Halir, R. Ortega-Moux, A. Molina-Fernandez, I. Wanguemert-Perez, J.G. Cheben, P. Dan-Xia Xu Lamontagne, B. Janz, S.
Copyright Year	1983
Abstract	The six-port reflectometer technique enables simple and accurate measurement of optical reflection coefficients in both magnitude and phase. The reflection coefficient is computed from four power measurements of linear combinations of the waves incident and reflected from the device under test. While the six-port technique is very successful at microwave frequencies and conceptually related to coherent optical phase diversity receivers, no optical implementations have been reported so far. In this paper, we present an experimental characterization of an optical six-port reflectometer composed of three multimode interference couplers, fabricated with a single etch step in silicon on insulator. Measurements are performed using a novel technique with a simple setup. The six-port combines the incident and reflected waves with magnitude and phase errors less than plusmn0.5 dB and plusmn6deg in the 1485-1575 nm band.
Sponsorship	IEEE Lasers and Electro-Optics Society Optical Society of America
Starting Page	5405
Ending Page	5409
Page Count	5
File Size	814515
File Format	PDF
ISSN	07338724
Volume Number	27
Issue Number	23
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Integrated optics Silicon on insulator technology Optical receivers Optical reflection Phase measurement Power measurement Testing Microwave frequencies Interference Couplers six-port reflectometer Measurement optical interferometry optical network analysis planar lightwave circuit (PLC)
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics

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