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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Daoud, E.A. Nicolici, N. |
| Copyright Year | 1982 |
| Abstract | Silicon debug is becoming a key step in the implementation flow for the purpose of identifying and fixing design errors that have escaped pre-silicon verification. To address the lack of observability for the internal circuit nodes during silicon debug, embedded logic analysis enables real-time data acquisition from a limited number of internal signals. In this paper, we propose a novel architecture for embedded logic analysis that enables real-time lossless compression of debug data. To quantify the gain from using lossless compression in embedded logic analysis, we present a new compression-ratio metric that captures the trade-off between the area and the increase in the observation window. The proposed architecture is particularly suitable for in-field debugging on application boards, which have asynchronous events that inhibit the deterministic replay of debug experiments. |
| Sponsorship | IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society |
| Starting Page | 1387 |
| Ending Page | 1400 |
| Page Count | 14 |
| File Size | 1010211 |
| File Format | |
| ISSN | 02780070 |
| Volume Number | 28 |
| Issue Number | 9 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Silicon Computer bugs Logic circuits Manufacturing Time to market Fabrication Circuit testing Logic testing Software debugging Failure analysis silicon debug Embedded logic analysis lossless compression |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software |
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