NDLI: Double–Single Stuck-at Faults: A Delay Fault Model for Synchronous Sequential Circuits

Content Provider	IEEE Xplore Digital Library
Author	Pomeranz, I. Reddy, S.M.
Copyright Year	1982
Abstract	In this paper, we describe a new transition fault model for synchronous sequential circuits. Similar to previous models, it addresses the fact that delayed signal-transitions span multiple clock cycles when a test sequence is applied at-speed. It addresses this issue in a different way than earlier models. The model requires the activation of single stuck-at faults with opposite stuck-at values on the same line g at consecutive time units. In addition, it requires the detection of both faults (as single faults) at the same or later time units. Due to the activation of the faults at consecutive time units, there is a 1 rarr 0 or 0 rarr 1 transition at the fault site g. Since both faults are eventually detected, a deviation from the expected value at either the first or second time unit due to a delay fault on g or due to transitions that started earlier and did not settle will be (or is likely to be) detected. The model can be used together with other models to increase the confidence that delay defects will be detected. As an added advantage, the model helps detect other types of faults that require two-pattern tests, such as transistor stuck-open faults.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	426
Ending Page	432
Page Count	7
File Size	227996
File Format	PDF
ISSN	02780070
Volume Number	28
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Sequential circuits Circuit testing Clocks Fault detection Electrical fault detection Sequential analysis Delay effects Circuit simulation Cities and towns transition faults Stuck-at faults synchronous sequential circuits
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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