NDLI: Compensation and Photosensitivity in CdTe Doped With Indium

Content Provider	IEEE Xplore Digital Library
Author	Babentsov, V. Franc, J. James, R.B.
Copyright Year	1963
Abstract	To better our knowledge of the characteristics of semi-insulated cadmium telluride (CdTe) doped with indium (In), we explored the role of deep levels in compensation and trapping. We assessed the defects and their distribution across a wafer in several ways; by measuring dark resistivity and photosensitivity maps, photoluminescence, Photo-Induced Current Transient Spectroscopy (PICTS), and Thermoelectric Effect Spectroscopy (TEES). We determined that electron trapping to a near midgap level in CdTe:In begins when the Fermi-level lies above this level. We demonstrated first that a small movement (ap 1divide2 kT) of the Fermi-level downward significantly increases electron trapping. PICTS and TEES measurements confirmed the presence of a positively charge electron trap at E _C-0.65 eV (plusmn 0.05 eV) with a high capture cross-section. This level transforms into a neutral one when the Fermi-level moves above it. Photoluminescence measurements detected this energy level that, when positively charged, was responsible for a 0.68-eV emission, while in a neutral state, it was accountable for an emission peak located at 0.87 eV. We discuss the nature of the deep donors, considering the latest ldquoab initiordquo calculations: also, the Te anti-site is compared to complex defects, such as H-O_Cd.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	1724
Ending Page	1730
Page Count	7
File Size	462917
File Format	PDF
ISSN	00189499
Volume Number	56
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-08-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Indium Electron traps Current measurement Photoluminescence Spectroscopy Cadmium compounds Conductivity Thermoelectricity Charge measurement Energy measurement trapping CdTe compensation mechanism deep donor radiation detectors
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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