NDLI: Device Verification Testing of High-Speed Analog-to-Digital Converters in Satellite Communication Systems

Content Provider	IEEE Xplore Digital Library
Author	Seokjin Kim Elkis, R. Peckerar, M.
Copyright Year	1963
Abstract	This paper presents a step-by-step sequence of operations for the dynamic performance testing of a high-speed analog-to-digital converter (ADC) using on-chip digital demultiplexing and clock distribution. Demultiplexed digital outputs are postprocessed and fed into a computer-aided ADC performance characterization tool. The described methodology reduces test costs and overcomes many test hardware limitations. The problems of high-sampling-rate ADC testing are described. As our focus is on RF communication system applications, we emphasize the measurement of intermodulation distortion (IMD) and effective resolution bandwidth (ERB). Accurate gain and phase matching are also of critical importance. As Fourier analysis is an important component of characterization, we address the issue of automated sample window adjustment to eliminate leakage and false spur generation. A 6-bit 800 MSample/s dual-channel SiGe-based ADC is used as a target example.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	270
Ending Page	280
Page Count	11
File Size	1685402
File Format	PDF
ISSN	00189456
Volume Number	58
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Analog-digital conversion Satellite communication Demultiplexing Clocks Costs Hardware Radio frequency Application software Distortion measurement spurious-free dynamic range (SFDR) Analog-to-digital converters (ADCs) demultiplexing effective number of bits (ENOB) fast Fourier transform (FFT) intermodulation testing satellite receiver SiGe BiCMOS ADCs sine-wave histogram testing single tone testing
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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