NDLI: Dielectric response measurements utilizing semi-square voltage waveforms

Content Provider	IEEE Xplore Digital Library
Author	Sonerud, B. Bengtsson, T. Blennow, J. Gubanski, S.M.
Copyright Year	1994
Abstract	Dielectric response measurements belong to the group of diagnostic tools used for quality evaluation of high voltage insulation systems. A measurement system called arbitrary waveform impedance spectroscopy (AWIS) is presented here which is capable of utilizing the harmonic content of repetitive voltages with a semi-square waveform and the corresponding current response to perform dielectric response measurements. Extensive circuit modeling and calibrations are required in order to perform accurate measurements. AWIS could offer new possibilities, especially for continuous monitoring of the dielectric properties of high voltage components and systems. The accuracy of the technique in both low and high voltage applications is verified by comparison with results obtained by means of the frequency domain spectroscopy (FDS) technique.
Sponsorship	National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA
File Size	1700173
File Format	PDF
ISSN	10709878
Volume Number	15
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-08-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectric measurements Voltage measurement Current measurement Impedance measurement Performance evaluation Dielectrics and electrical insulation Electrochemical impedance spectroscopy Circuits Calibration Monitoring Dielectric measurements, discrete Fourier transforms, aging, monitoring, dielectric materials, insulation testing
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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