NDLI: Stochastic Theory of Edge Diffraction

Content Provider	IEEE Xplore Digital Library
Author	Franceschetti, G. Iodice, A. Natale, A. Riccio, D.
Copyright Year	1963
Abstract	We introduce an original formulation for the electromagnetic field diffraction by a knife edge with random roughness: the formulation, based on the asymptotic physical optics approach, leads to closed form evaluations of the statistics of the diffracted field. The edge roughness is described by a stationary zero-mean Gaussian stochastic process with standard deviation sigma and correlation length L. The physical optics approximation is used to evaluate surface currents; mean and variance of the diffracted field are evaluated by means of asymptotic techniques under the hypotheses lambda/r rarr 0, where lambda is the wavelength and r is the distance from the edge, sigma not large with respect to lambda, and sigma/r Lt 1. The main advantages of the proposed method are its simplicity and the fact that, differently from other approaches, the obtained total field is explicitly written as the sum of incident, reflected and diffracted fields. A very interesting conclusion is that, for moderate edge roughness, the diffracted field propagation can be described in terms of the same ray congruence as in the straight (smooth) edge case, with the only difference that the field associated to each ray is a random variable whose statistics are, in this paper, computed in closed form. The presented approach can be then considered as a first step toward a general stochastic theory of edge diffraction. The proposed theoretical results are amenable of interesting practical applications: for instance, the obtained diffracted field statistics can be used to predict the maximum accuracy that can be expected for ray-tracing algorithms that are based on the straight edge assumption.
Sponsorship	IEEE Antennas and Propagation Society
Starting Page	437
Ending Page	449
Page Count	13
File Size	1099123
File Format	PDF
ISSN	0018926X
Volume Number	56
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stochastic processes Optical diffraction Electromagnetic diffraction Statistics Physical optics Electromagnetic fields Surface waves Optical surface waves Rough surfaces Surface roughness ray optical methods Far-field scattering computations multilevel fast multipole methods planar near-field scanning techniques plane wave spectrum expansions
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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