NDLI: Multiple Edge Responses for Fast and Accurate System Simulations

Content Provider	IEEE Xplore Digital Library
Author	JiHong Ren Kyung Suk Oh
Copyright Year	1999
Abstract	High-speed input/output (I/O) link performance is limited by random noise as well as signal integrity issues such as dispersion, reflections, and crosstalk. Hence, accurate prediction of system performance including these random and deterministic noise is crucial in high-speed link design. This paper presents a novel, fast, and accurate method to simulate the time-domain system response. The presented method calculates the system response using multiple edge responses (MER) based on linear superposition. Being able to take into account system nonlinearity more accurately, the presented method significantly improves simulation accuracy compared with the other published fast simulation techniques based on either single bit response (SBR) or double edge responses (DER), while at the same time maintaining equivalent numerical efficiency. Furthermore, peak distortion analysis, which is commonly used to find the worst-case data pattern based on SBR, is extended for DER and MER using dynamic programming. A multiphase worst-case data pattern approach is also introduced in this paper in order to determine the worst-case system performance under both timing and voltage consideration.
Sponsorship	IEEE Components, Packaging, and Manufacturing Technology Society IEEE Components, Packaging and Manufacturing Technology Society
Starting Page	741
Ending Page	748
Page Count	8
File Size	1080197
File Format	PDF
ISSN	15213323
Volume Number	31
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-11-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Intersymbol interference System performance Density estimation robust algorithm Crosstalk Circuit simulation Bit error rate Pattern analysis Analytical models Computational modeling SPICE worst case estimation Channel simulation edge response intersymbol interference (ISI) characterization peak distortion analysis single bit response transient simulation
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Multiple Edge Responses for Fast and Accurate System Simulations

An improved multiple edge responses method for memory simulation considering worst case and nonlinear crosstalk

Iterative Detection and Decoding for Separable Two-Dimensional Intersymbol Interference (2003)

Predictions of the Worst-Case Crosstalk Including ISI Effect and the Worst-Case Eye Opening Including Crosstalk Effect for Electronic Packaging System Design

Statistical and transient channel modeling for crosstalk, bit error, jitter, and EMI

Fast ISI Characterization of Passive Channels Using Extreme Value Distribution

EM algorithm for sequence estimation over Gauss-Markov ISI channels

Accurate system voltage and timing margin simulation in high-speed i/o system designs.

The influence of non-linear distortion on OFDM bit error rate

Multiple Edge Responses for Fast and Accurate System Simulations

Similar Documents

Multiple Edge Responses for Fast and Accurate System Simulations

An improved multiple edge responses method for memory simulation considering worst case and nonlinear crosstalk

Iterative Detection and Decoding for Separable Two-Dimensional Intersymbol Interference (2003)

Predictions of the Worst-Case Crosstalk Including ISI Effect and the Worst-Case Eye Opening Including Crosstalk Effect for Electronic Packaging System Design

Statistical and transient channel modeling for crosstalk, bit error, jitter, and EMI

Fast ISI Characterization of Passive Channels Using Extreme Value Distribution

EM algorithm for sequence estimation over Gauss-Markov ISI channels

Accurate system voltage and timing margin simulation in high-speed i/o system designs.

The influence of non-linear distortion on OFDM bit error rate

Multiple Edge Responses for Fast and Accurate System Simulations