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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Boumen, R. de Jong, I.S.M. Vermunt, J.W.H. van de Mortel-Fronczak, J.M. Rooda, J.E. |
| Copyright Year | 1996 |
| Abstract | Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, which is the test-sequencing problem, was already solved by Pattipati et al. for the diagnosis of systems during operation. Test-sequencing problems during the development and manufacturing phases of systems, however, require a different approach than the test-sequencing problems during operation. In this paper, the test problem description and algorithms developed by Pattipati et al. are extended to solve test-sequencing problems for the development and manufacturing of manufacturing systems. For a case study in the manufacturing process of an ASML lithographic machine, it is shown that solving a test-sequencing problem with this method can reduce the test time by 15% to 30% compared to experts that solve this problem manually. |
| Sponsorship | IEEE Systems, Man, and Cybernetics Society |
| Starting Page | 25 |
| Ending Page | 37 |
| Page Count | 13 |
| File Size | 512397 |
| File Format | |
| ISSN | 10834427 |
| Volume Number | 38 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | System testing Manufacturing systems Sequential diagnosis Sequential analysis Electronics industry Semiconductor device testing Manufacturing processes Time to market Manufacturing industries Lithography test strategy and/or graphs manufacturing systems semiconductor industry TANGRAM test sequencing AND/OR graphs |
| Content Type | Text |
| Resource Type | Article |
| Subject | Control and Systems Engineering Information Systems Electrical and Electronic Engineering Human-Computer Interaction Computer Science Applications Software |
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