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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Catapano, I. Crocco, L. D'Urso, M. Isernia, T. |
| Copyright Year | 1963 |
| Abstract | Starting from the concept of "degree of non-linearity" of the relationship amongst unknown parameters and scattered fields, we discuss how knowledge of the geometrical features of the targets favorably affects the solution of inverse scattering problems. The same concept is also exploited to optimize the contrast source-extended Born (CS-EB) model, resulting in the optimized CS-EB (O-CS-EB) inversion approach, which remarkably reduces false solutions occurrence. Then, a two-steps approach is proposed as a reliable and effective inversion strategy. The first step consists in retrieving the shape of the targets using the linear sampling method, while in the second step, the estimated shapes and the O-CS-EB are exploited to reconstruct the permittivity profile. The approach has been tested against experimental data, showing that very accurate reconstructions are achieved from monochromatic data. |
| Sponsorship | IEEE Antennas and Propagation Society |
| Starting Page | 1895 |
| Ending Page | 1899 |
| Page Count | 5 |
| File Size | 425651 |
| File Format | |
| ISSN | 0018926X |
| Volume Number | 55 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Inverse problems Electromagnetic scattering Image reconstruction Shape Permittivity Sampling methods Testing Optimization methods Solid modeling Scattering parameters shape reconstruction Contrast source-extended Born (CS-EB) electromagnetic inverse scattering problems |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering |
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