NDLI: Nondestructive sensing of physical properties of granular materials by microwave permittivity measurement

Content Provider	IEEE Xplore Digital Library
Author	Trabelsi, S. Nelson, S.O.
Copyright Year	1963
Abstract	The dielectric properties of wheat, corn, and soybeans were determined by measuring the scattering transmission coefficient S₂₁ in free space at frequencies between 2 and 13 GHz. For better accuracy, a pair of horn-lens antennas was used and time-domain gating was applied to the main response. Variations of the dielectric properties with frequency and physical properties such as bulk density, moisture content, and temperature were investigated. Both the dielectric constant and the loss factor decreased with frequency and increased linearly with bulk density, moisture content, and temperature. Three different approaches are used to correlate the measured dielectric properties and physical properties. Explicit relationships between the dielectric properties and the different physical properties are given at a midrange frequency of 7.0 GHz as an example. The potential use of these relationships is shown for the development of indirect methods for the nondestructive and instantaneous determination of the physical properties of cereal grain and seed from measurements of their dielectric properties. Different sources of error in attenuation and phase shift measurement are discussed, and their effects on the accuracy for the determination of the relative complex permittivity and physical properties are investigated
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	953
Ending Page	963
Page Count	11
File Size	422077
File Format	PDF
ISSN	00189456
Volume Number	55
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Permittivity measurement Dielectric measurements Moisture Temperature Dielectric materials Antenna measurements Frequency measurement Scattering Horn antennas Time domain analysis temperature Bulk density complex permittivity dielectric properties free space granular materials indirect methods microwave frequencies moisture content nondestructive sensing
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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