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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cheng-Shih Lee Yi-Chung Lien Chang, E.Y. Huang-Choung Chang Szu-Houng Chen Ching-Ting Lee Li-Hsin Chu Shang-Wen Chang Yen-Chang Hsieh |
| Copyright Year | 1963 |
| Abstract | A GaAs pseudomorphic HEMT (PHEMT) with Cu-metallized interconnects was successfully developed. Sputtered WNx was used as the diffusion barrier and Ti was used as the adhesion layer to improve the adhesion between WNx/Cu interface in the thin-metal structure. After copper metallization, the PHEMTs were passivated with silicon nitride to avoid copper oxidation. The Cu-airbridged PHEMT showed the saturation IDS was 250 mA/mm and the gm was 456 mS/mm. The Ti adhesion layer plays a significant role on the g m and Vp uniformity of the Cu-metallized PHEMTs. The GaAs PHEMTs with Ti/WNx/Ti/Cu multilayer have better noise figure and associated gain than those of the devices without the Ti adhesion layer. The fabricated Cu-metallized GaAs PHEMT with Ti/WN x/Ti/Cu multilayer has a noise figure of 0.76 dB and an associated gain of 8.8 dB at 16 GHz. The cutoff frequency (fT) is 70 GHz when biased at VDS=1.5V. These results show that the Ti/WNx/Ti multilayer can serve as a good diffusion barrier for Cu metallization process of airbridge interconnects on GaAs lownoise PHEMTs |
| Sponsorship | IEEE Electron Devices Society |
| Starting Page | 1753 |
| Ending Page | 1758 |
| Page Count | 6 |
| File Size | 721231 |
| File Format | |
| ISSN | 00189383 |
| Volume Number | 53 |
| Issue Number | 8 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | pseudomorphic HEMT (PHEMT) Airbridge copper metallization diffusion barrier GaAs noise figure |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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