NDLI: Electrical characterization of new and aged semiconducting glazes

Content Provider	IEEE Xplore Digital Library
Author	Urich, H. Gubanski, S.M.
Copyright Year	1994
Abstract	This paper presents the electrical characterization of antimony-doped semiconducting glazes before and after exposure to AC and DC electric fields under outdoor conditions and in the laboratory using the rotating-wheel-dip test (RWDT). Measurements of the I-V characteristics as well as dielectric spectroscopy in frequency domain (FDS) were performed on new and aged samples and results were compared. While I-V data only show a decrease in the current with aging, FDS data show more detailed features. Besides a decrease in DC conductance, a strong increase in low frequency dispersion (LFD) was found and a decrease in the relaxation polarization was indicated. The latter was more pronounced for samples aged under DC voltage. The observed relaxation polarization could originate from the presence of a low-conductive glassy surface layer on top of the "bulk" semiconducting glaze and it was weakened by the appearance of surface changes, including damage of the glassy surface layer, which thereby opened an alternative path for the current flow from the electrode to the "bulk" semiconducting glaze. The increase in LFD could be attributed to moisture trapped in the surface cracks formed during aging
Sponsorship	National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA
Starting Page	24
Ending Page	33
Page Count	10
File Size	1048772
File Format	PDF
ISSN	10709878
Volume Number	12
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aging Semiconductivity Glazes Surface cracks Polarization Electric fields Laboratories Semiconductor device testing Dielectric measurements Frequency measurement
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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