NDLI: Efficient estimation of sensitivities in TLM with dielectric discontinuities

Content Provider	IEEE Xplore Digital Library
Author	Basl, P.A.W. Bakr, M.H. Nikolova, N.K.
Copyright Year	2001
Abstract	We present two novel approaches for efficient estimation of objective function sensitivities related to dielectric discontinuities with time-domain transmission line modelling. Using only two simulations, of the original and adjoint structures, the sensitivities with respect to all parameters are obtained. The first approach utilizes an approximation of the adjoint problem. It adapts a recent approach that handles perfectly conducting discontinuities. The second approach exploits the analytic dependence of the nodal scattering matrix on the material properties. The adjoint problem is exact for this case. Our approaches are illustrated through examples involving waveguide dielectric discontinuities.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	89
Ending Page	91
Page Count	3
File Size	143274
File Format	PDF
ISSN	15311309
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectrics Transmission line discontinuities Electromagnetic scattering Transmission line matrix methods Material properties Electromagnetic modeling Process design Time domain analysis Transmission lines Electromagnetic waveguides transmission line modeling (TLM) CAD electromagnetic (EM) modeling
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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