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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | von Arnim, K. Borinski, E. Seegebrecht, P. Fiedler, H. Brederlow, R. Berthold, J. Pacha, C. |
| Copyright Year | 1966 |
| Abstract | The efficiency of body biasing for leakage reduction and performance improvement in a 90-nm CMOS low-power technology with triple-well option is evaluated. Static measurements of single devices and dynamic measurements of ring oscillators and 32-b parallel prefix adders are presented. Whereas forward biasing still provides a significant performance improvement of up to 37% for low-leakage devices with 2.2-nm gate oxide thickness, the application of reverse biasing to reduce subthreshold leakage currents is inefficient due to additional leakage currents such as gate leakage and gate-induced drain leakage. Experimental results confirm that, in 90-nm CMOS circuits, the efficiency of body biasing strongly depends on the device type and operating temperature. Moreover, the impact of the zero-temperature coefficient point on static device and dynamic circuit performance is investigated. |
| Sponsorship | IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE |
| Starting Page | 1549 |
| Ending Page | 1556 |
| Page Count | 8 |
| File Size | 819803 |
| File Format | |
| ISSN | 00189200 |
| Volume Number | 40 |
| Issue Number | 7 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-07-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | CMOS digital integrated circuits Digital circuits CMOS technology Leakage current Ring oscillators Adders Subthreshold current Gate leakage Temperature dependence Circuit optimization zero-temperature coefficient point Body biasing |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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