NDLI: Heavy ion and pulsed laser SET measurements in ultrahigh speed MSM GaAs photodetectors

Content Provider	IEEE Xplore Digital Library
Author	Laird, J.S. Hirao, T. Onoda, S. Itoh, H.
Copyright Year	1963
Abstract	Single Event Transient (SET) measurements using both focused MeV heavy ions and pulsed picosecond lasers are employed to examine the injection and spatial dependence of SETs in high speed GaAs MSM photodetectors. Ion track structure and its influence on the average electron-hole pair density result in space-charge effects which determine the SET duration and possible BER contamination over more than one decision cycle of a GHz modulation based communication system. Laser probing is used to confirm the existence of space-charge effects and scanned SET measurements using an MeV ion microbeam are used to examine the spatial dependence of SET formation. Finally, ISE-TCAD simulations are performed to examine signal generation under high-injection conditions where space-charge effects prevail.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	1504
Ending Page	1512
Page Count	9
File Size	1249823
File Format	PDF
ISSN	00189499
Volume Number	52
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Pulse measurements Optical pulses Velocity measurement Gallium arsenide Photodetectors Pollution measurement Bit error rate Fingers Contamination Degradation
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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