NDLI: Allan variances and spectral densities for DC voltage measurements with polarity reversals

Content Provider	IEEE Xplore Digital Library
Author	Witt, T.J.
Copyright Year	1963
Abstract	Using a polarity reversal technique, precise dc voltage measurements were made with both digital and analog voltmeters. The results were analyzed by calculating Allan variances and spectral densities for polarity-reversed measurements and comparing them with similar analyses of unreversed or unipolar measurements of the same processes. The Allan variances and spectra for the two measurement methods were found to agree quite well, particularly for sampling times corresponding to the 1/f noise regime for the measurement of Zener-diode voltages. The results show that polarity reversals do not affect 1/f noise of the Zeners. In polarity-reversed measurements, a rectangular voltage waveform is presented to the detector. Since this waveform can be synthesized by ac waveforms, the results also demonstrate that ac detection does not remove 1/f noise in the voltage source being measured. We also estimated the spectral density and Allan variance of some thermal (Johnson) noise processes and found that the results agree with the Nyquist expression to within 4%. This provides direct validation of our measurement and analysis methods.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	550
Ending Page	553
Page Count	4
File Size	180436
File Format	PDF
ISSN	00189456
Volume Number	54
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Density measurement Voltage measurement Noise measurement Voltmeters Switches Analysis of variance Particle measurements Detectors Spectral analysis White noise white noise noise measurement spectral analysis
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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