NDLI: An intelligent view box system for cephalometry

Content Provider	IEEE Xplore Digital Library
Author	Yen-Ting Chen Kuo-Sheng Cheng Jia-Kuang Liu Ji-Jer Huang
Copyright Year	1963
Abstract	In the routine analysis of cephalometry, the orthodontist usually needs to manually draw the tracing paper with the help of the view box, and then some cephalometric measurements are performed to evaluate growth aspects of the skull and the effects of treatment. Due to the varied display quality and clinical training, many orthodontists rely heavily on the view box rather than the computer monitor for cephalometry. Without the appropriate and affordable digital imaging devices, the computerized analysis for cephalometry is hard to apply in practice. In this paper, a novel design of an intelligent view box that combines an X-ray film view box, a touch panel, and analysis software is proposed. It is designed for acquiring both the landmarks and feature curves of the cephalogram for the automated cephalometric system use. There are two merits of the proposed system. One is that the relationship between the label and position for manually defined landmarks may be automatically corrected, and the other is that the manual drawing process may be automatically followed and guided based on the cephalogram. In addition, the proposed system also includes an image manipulation system. Thus, both the landmarks and feature curves may be automatically and correctly overlaid on the cephalogram for further assessment. From the experimental results, the repeated repositioning of the pen in ten times only produces a standard deviation not more than 0.5 mm in x and y directions. The spatial resolution for the proposed intelligent view box system is about 164 pixels/inch. It is demonstrated to be very useful in the clinics for the automated cephalometric analysis.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	98
Ending Page	104
Page Count	7
File Size	1788330
File Format	PDF
ISSN	00189456
Volume Number	54
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Intelligent systems Computer displays Performance analysis Performance evaluation Skull Digital images Image analysis X-ray imaging Spatial resolution Smart pixels X-ray film Cephalometry touch panel view box
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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