NDLI: Models of charge transport in electron-beam irradiated insulators

Content Provider	IEEE Xplore Digital Library
Author	Sessler, G.M. Figueiredo, M.T. Ferreira, G.F.L.
Copyright Year	1994
Abstract	Charge transport in electron-beam irradiated insulators can be studied with various theoretical models based on different assumptions concerning generation, drift, trapping, and recombination of the charge carriers. In the past, two models have been of particular interest. A first macroscopic approach is based on the concept of a radiation-induced conductivity (RIC) generated by the injected electrons. As opposed to this, the second microscopic scheme utilizes a detailed description of carrier generation and recombination in the insulator. While the macroscopic model requires the information of the RIC, the microscopic approach, resulting in a more complicated set of equations, calls for generation and recombination rates in addition to information about mobility and trapping of the more mobile carriers. Comparisons of numerical results from the two models for open-circuit conditions indicate that charge distributions and locations of charge peak and charge centroid are in fair to good agreement, depending on assumptions made for the main parameters. Further comparisons of the simulation results with experimental data for charge distributions and locations of charge peaks in fluoroethylenepropylene and polyimide show that the macroscopic model, with independently determined values for the RIC, yields good agreement with the experimental data. For the microscopic model, good agreement with experiment can also be achieved with properly chosen values of the partially unknown parameters.
Sponsorship	National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA
Starting Page	192
Ending Page	202
Page Count	11
File Size	917421
File Format	PDF
ISSN	10709878
Volume Number	11
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Insulation Spontaneous emission Electron traps Microscopy Conductivity Equations Polyimides Electrets Charge carriers Solid state circuits
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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