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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bray, J.R. Kautio, K.T. Roy, L. |
| Copyright Year | 1999 |
| Abstract | An experimental-low temperature cofired ceramic (LTCC) ferrite tape system is characterized using circuits that are fabricated from the very material under test. Such in situ circuits provide data that are thought to be more representative of the performance obtainable by more complicated circuitry that will eventually be made from the same material using the same fabrication method. Emphasis is placed on simple measurements that can be performed using a minimum amount of equipment. For the first time, a compact in situ LTCC solenoid transformer is used to measure the magnetostatic properties of the ferrite, yielding a measured saturation flux density of 230 mT, a remanence of 136 mT, and a coercivity of 688 A/m. The peak linear relative permeability of the ferrite is 97 and its Curie temperature is low, only 117/spl deg/C. A novel two-port line-connected ring resonator is used to characterize the material in the 6-40 GHz range. At frequencies above 20 GHz, the relative permittivity of the ferrite is 11.0, whereas its loss tangent ranges from 0.002 to 0.004, demonstrating the ferrite's suitability for use in microwave and millimeter-wave circuitry. |
| Sponsorship | IEEE Components, Packaging, and Manufacturing Technology Society IEEE Components, Packaging and Manufacturing Technology Society |
| Starting Page | 558 |
| Ending Page | 565 |
| Page Count | 8 |
| File Size | 1029290 |
| File Format | |
| ISSN | 15213323 |
| Volume Number | 27 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Ferrites Millimeter wave circuits Millimeter wave technology Temperature Circuit testing Density measurement Time measurement Ceramics Materials testing System testing |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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