NDLI: TMR voting in the presence of crosstalk faults at the voter inputs

Content Provider	IEEE Xplore Digital Library
Author	Favalli, M. Metra, C.
Copyright Year	1963
Abstract	In high reliability systems, the effectiveness of fault tolerant techniques, such as Triple-Modular-Redundancy (TMR), must be validated with respect to the faults that are likely in the current technology. In todays' Integrated Circuits (IC), this is the case of crosstalks, whose importance is growing because of device & interconnect scaling. This paper analyzes the problem of crosstalk faults at the inputs of voters in TMR systems. In particular, possible problems are illustrated, and it is shown that such crosstalk may invalidate the reliability of both voting, and diagnosing operations. The problem is analyzed from a probabilistic point of view. Its occurrence is estimated by using a set of TMR systems obtained with combinational benchmarks as functional modules. The possible problems of such operations are discussed in the presence of crosstalk faults. It is shown that crosstalk may invalidate the reliability of both voting, and diagnosis operations. A probabilistic model of the voting & diagnosis operations in the presence of crosstalk has been developed. Finally, such a model has been used to estimate the probability of voting & diagnosis failures in a set of TMR systems obtained by using combinational benchmarks as functional modules. We have shown that the presence of crosstalk faults at voter inputs may impair both the voting, and the diagnosis mechanisms. This problem has been quantified by applying a probabilistic model of crosstalk fault effects on voting and diagnosis to a set of benchmark circuits. Results show that crosstalk may create a reliability problem for TMR systems. Such a problem can be solved by using on-line testing or design for testability providing additional controllability & observability to the replicated functional units.
Sponsorship	IEEE Reliability Society
Starting Page	342
Ending Page	348
Page Count	7
File Size	196328
File Format	PDF
ISSN	00189529
Volume Number	53
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Voting Crosstalk Circuit faults Fault diagnosis Integrated circuit reliability Fault tolerant systems Integrated circuit technology Integrated circuit interconnections Benchmark testing Circuit testing
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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