NDLI: Using data compression in automatic test equipment for system-on-chip testing

Content Provider	IEEE Xplore Digital Library
Author	Karimi, F. Navabi, Z. Meleis, W.M. Lombardi, F.
Copyright Year	1963
Abstract	Compression has been used in automatic test equipment (ATE) to reduce storage and application time for high volume data by exploiting the repetitive nature of test vectors. The application of a binary compression method to an ATE environment for manufacturing is studied using a technique, referred to as reuse. In reuse, compression is achieved by partitioning the vector set and removing repeating segments. This process has O(n/sup 2/) time complexity for compression (where n is the number of vectors) with a simple hardware decoding circuitry. It is shown that for industrial system-on-chip (SoC) designs, the efficiency of the reuse compression technique is comparable to sophisticated software techniques with the advantage of easy and fast decoding. Two shift register-based decompression schemes are presented; they can be either incorporated into internal scan chains or built in the tester's head. The proposed compression method has been applied to industrial test and data and an average compression rate of 84% has been achieved.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	308
Ending Page	317
Page Count	10
File Size	690818
File Format	PDF
ISSN	00189456
Volume Number	53
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Data compression Automatic test equipment System-on-a-chip Automatic testing System testing Decoding Storage automation Manufacturing Hardware Circuits
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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