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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Fan Zhang Ming Li Chen, W.T. Chian, K.S. |
| Copyright Year | 1999 |
| Abstract | Flux is necessary to promote wetting between solder and metallized surfaces during flip chip bonding process. However, flux residues are unavoidable and may have detrimental effects on the properties of the underfill materials. In this study, the effects of flux residues from a commercial no-clean flux on two types of underfills were systematically investigated using a contact angle goniometer, thermal mechanical analyzer (TMA), thermogravimetric analyzer (TGA) and dynamic mechanical analyzer (DMA). It was found that the presence of flux residue reduced the glass transition temperatures (Tg) of both cured underfills studied. Although /spl alpha//sub 1/ (CTE below Tg) of cured underfills were slightly affected, /spl alpha//sub 2/ (CTE above Tg) increased significantly. The DMA tan/spl delta/ curves of flux residue contaminated samples were found to be broader than those of pure underfills. In addition, the rubbery storage moduli of underfills contaminated with flux residues also decreased significantly. The existence of flux residues was found to increase the moisture absorption of the cured underfills. |
| Sponsorship | IEEE Components, Packaging, and Manufacturing Technology Society |
| Starting Page | 233 |
| Ending Page | 238 |
| Page Count | 6 |
| File Size | 1535670 |
| File Format | |
| ISSN | 15213331 |
| Volume Number | 26 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Flip chip Substrates Moisture Temperature Absorption Soldering Curing Glass Integrated circuit packaging Costs |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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