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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jiang, J.-H.R. Brayton, R.K. |
| Copyright Year | 1982 |
| Abstract | The state-explosion problem limits formal verification on large sequential circuits partly because the sizes of binary decision diagrams (BDDs) sizes heavily depend on the number of variables dealt with. In the worst case, a BDD size grows exponentially with the number of variables. Thus, reducing this number can possibly increase the verification capacity. In particular, this paper shows how sequential equivalence checking can be done in the sum state space. Given two finite state machines M/sub 1/ and M/sub 2/ with numbers of state variables m/sub 1/ and m/sub 2/, respectively, conventional formal methods verify equivalence by traversing the state space of the product machine with m/sub 1/+m/sub 2/ registers. In contrast, this paper introduces a different possibility, based on partitioning the state space defined by a multiplexed machine, which can have merely max{m/sub 1/,m/sub 2/}+1 registers. This substantial reduction in state variables potentially enables the verification of larger instances. Experimental results show the approach can verify benchmarks with up to 312 registers, including all of the control outputs of microprocessor 8085. |
| Sponsorship | IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society |
| Starting Page | 686 |
| Ending Page | 697 |
| Page Count | 12 |
| File Size | 857719 |
| File Format | |
| ISSN | 02780070 |
| Volume Number | 22 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | State-space methods Data structures Boolean functions Formal verification Binary decision diagrams Automata Registers Sequential circuits Microprocessors Very large scale integration |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software |
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