NDLI: Accelerator validation of an FPGA SEU simulator

Content Provider	IEEE Xplore Digital Library
Author	Johnson, E. Caffrey, M. Graham, P. Rollins, N. Wirthlin, M.
Copyright Year	1963
Abstract	An accelerator test was used to validate the performance of an FPGA single event upset (SEU) simulator. The Crocker Nuclear Laboratory cyclotron proton accelerator was used to irradiate the SLAAC1-V, a Xilinx Virtex FPGA board. We also used the SLAAC1-V as the platform for a configuration bitstream SEU simulator. The simulator was used to probe the "sensitive bits" in various logic designs. The objective of the accelerator experiment was to characterize the simulator's ability to predict the behavior of a test design in the proton beam during a dynamic test. The test utilized protons at 63.3 MeV, well above the saturation cross-section for the Virtex part. Protons were chosen because, due to their lower interaction rate, we can achieve the desired upset rate of about one configuration bitstream upset per second. The design output errors and configuration upsets were recorded during the experiment and compared to results from the simulator. In summary, for an extensively tested design, the simulator predicted 97% of the output errors observed during radiation testing. The SEU simulator can now be used with confidence to quickly and affordably examine logic designs to 'map' sensitive bits, to provide assurance that incorporated mitigation techniques perform correctly, and to evaluate the costs and benefits of various mitigation strategies. The simulator provides an excellent test environment that accurately represents radiation induced configuration bitstream upsets.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	2147
Ending Page	2157
Page Count	11
File Size	1402329
File Format	PDF
ISSN	00189499
Volume Number	50
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Field programmable gate arrays Testing Single event upset Proton accelerators Life estimation Logic design Predictive models Discrete event simulation Laboratories Cyclotrons
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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