NDLI: High-frequency input impedance characterization of dielectric films for power-ground planes

Content Provider	IEEE Xplore Digital Library
Author	Obrzut, J. Anopchenko, A.
Copyright Year	1963
Abstract	Broadband impedance characterization of high dielectric constant (high-k) films was performed using a coaxial test fixture configuration. The presented coaxial test fixture and broadband measurement methodology of impedance for high-k films minimizes systematic uncertainties by reducing the interconnection inductance and improving the calibration procedure. In the APC-7 configuration, the technique enables accurate evaluation of impedance at frequencies of 100 MHz to 10 GHz with resolution of 0.01 /spl Omega/. The electrical characteristic of high-k films was found to be consistent with a capacitive load without significant contribution from the circuit inductance that typically dominates the high-frequency response. The experimental data and numerical simulations showed that high-k organic-ceramic composite materials could considerably suppress resonant behavior of the power-ground planes. It was found that high-k organic resins filled with ferroelectric ceramic powders exhibit a high-frequency dielectric loss that increases with increasing volume fraction of the ceramic component. The dielectric dispersion and the corresponding dielectric loss of organic-ceramic hybrid materials can serve as an effective mechanism for suppressing the resonant standing waves in power-ground planes.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1120
Ending Page	1124
Page Count	5
File Size	274097
File Format	PDF
ISSN	00189456
Volume Number	52
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-08-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Impedance Dielectric films High-K gate dielectrics High K dielectric materials Dielectric losses Coaxial components Fixtures Resonance Ferroelectric materials Ceramics
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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