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Content Provider | IEEE Xplore Digital Library |
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Author | Yi Tang Fedison, J.B. Chow, T.P. |
Copyright Year | 1980 |
Abstract | Implanted-emitter, epi-base, npn 4H-SiC bipolar junction transistors (BJTs) which show maximum blocking voltage of 500 V and common-emitter current gain (/spl beta/) of 8 are demonstrated. Compared to the previous results (BV/sub CEO/ of 60 V and /spl beta/ of 40), the blocking voltage is greatly improved with reduced current gain due to a decrease of the base transport factor. The samples also show negative temperature coefficient of /spl beta/, similar to the previous samples, easing device paralleling problems. |
Sponsorship | IEEE Electron Devices Society |
Starting Page | 16 |
Ending Page | 18 |
Page Count | 3 |
File Size | 50454 |
File Format | |
ISSN | 07413106 |
Volume Number | 23 |
Issue Number | 1 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2002-01-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Voltage Temperature Annealing Implants Argon Power semiconductor devices Application specific integrated circuits Silicon carbide Bipolar transistors Process control |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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