NDLI: Parameter measurement of thin elastic layers using low-frequency multi-mode ultrasonic lamb waves

Content Provider	IEEE Xplore Digital Library
Author	Rui Zhang Mingxi Wan Wenwu Cao
Copyright Year	1963
Abstract	A low-frequency ultrasonic method presented in this paper is suitable for measuring any one of the four characteristic parameters, i.e., thickness, density, shear, and longitudinal wave velocities, of a thin elastic layer given the remaining three. Thickness of the thin layer is much smaller than the longitudinal wavelength of the ultrasonic wave used in the experiments. The method employs the water immersion pitch-catch technique, and is based on the dispersion properties of the first-order symmetric and anti-symmetric modes of a Lamb waveguide. The unknown parameter is estimated by minimizing the mean square error obtained by comparing theoretical dispersion curves with experimental data. A wide-band excitation technique is used to reduce measurement time, by which a frequency range of possible guided Lamb waves is simultaneously explored. The sensitivity and accuracy of the proposed technique for different parameters in different thicknesses are analyzed. Using the present technique, a thin layer with thickness down to one percent of the longitudinal wavelength can be successfully measured with an average error of about two-percent. But the method fails to evaluate the density of the thin layer if the thickness is less than five percent of longitudinal wavelength.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1397
Ending Page	1403
Page Count	7
File Size	164767
File Format	PDF
ISSN	00189456
Volume Number	50
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Wavelength measurement Ultrasonic variables measurement Thickness measurement Density measurement Velocity measurement Water Parameter estimation Mean square error methods Wideband Frequency measurement
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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