NDLI: Test and measurement [Technology 2000 analysis and forecast]

Content Provider	IEEE Xplore Digital Library
Author	Bretz, E.A.
Copyright Year	1964
Description	The awareness that every electronic product, from PCs to Internet appliances, is pining for tinier and more powerful chips is whipping semiconductor development along at a frenetic pace. It is also hounding automation of design and test and IC test development, but test inevitably lags behind chip development. Devising (and performing) tests for the so-called system on a chip is a time-consuming process. Many thousands of test patterns and vectors must be created, as must protocols, and the fault coverage achieved must be high enough to complete the necessary testing and to minimize the cost. The challenges multiply further as the test chain ascends from chip to board to system and ultimately field-level tests. Each level adds expense so that soon, by some estimates, test could account for half of the final cost of a chip.
Starting Page	75
Ending Page	79
Page Count	5
File Size	519572
File Format	PDF
ISSN	00189235
Volume Number	37
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-01-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Technology forecasting Automatic testing Integrated circuit testing System testing Costs Semiconductor device measurement Personal communication networks Internet Home appliances Design automation
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Structuring STIL for incremental test development

Linking Design&Test

An Internet based wireless home automation system for multifunctional devices

Test and measurement

Automation comes to analog

Semiconductor perspective on test standards

Embedded test solution as a breakthrough in reducing cost of test for system on chips

IPv6 home network domain name auto-configuration for intelligent appliances

Computer aided design tools for power IC's

Test and measurement [Technology 2000 analysis and forecast]

Similar Documents

Structuring STIL for incremental test development

Linking Design&Test

An Internet based wireless home automation system for multifunctional devices

Test and measurement

Automation comes to analog

Semiconductor perspective on test standards

Embedded test solution as a breakthrough in reducing cost of test for system on chips

IPv6 home network domain name auto-configuration for intelligent appliances

Computer aided design tools for power IC's

Test and measurement [Technology 2000 analysis and forecast]