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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cliche, J.-F. Zarka, A. Tetu, M. Chartier, J.-M. |
| Copyright Year | 1963 |
| Abstract | The purpose of this paper is to develop a low-cost semiconductor laser frequency standard around 633 mm based on digital signal processing techniques. This standard sweeps the frequency of the laser by means of the injection current in order to measure some linear absorption transitions of iodine (/sup 127/I/sub 2/). It identifies those lines by using a reference table of known transitions of the iodine vapor and then automatically locks the frequency of the laser on a selected transition. A microcontroller and a digital signal processor are used to perform those functions. The effects of laser temperature, mode jumps, and transition linewidth are considered for successful operations. It is demonstrated that this system can automatically lock a 633 nm semiconductor laser on the P(33) 6-3 transition of iodine. |
| Sponsorship | IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc |
| Starting Page | 596 |
| Ending Page | 599 |
| Page Count | 4 |
| File Size | 163876 |
| File Format | |
| ISSN | 00189456 |
| Volume Number | 48 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-04-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Semiconductor lasers Laser transitions Laser mode locking Standards development Digital signal processing Measurement standards Current measurement Frequency measurement Absorption Microcontrollers |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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